Equipment specifications: :
High resolution scanning electron microscope with field-emission gun and focused ion beam (FIB-SEM, suitable for high-resolution analysis)
 

FIB-SEM Technology
• Maximizes sample quality using the low voltage features of the FIB column 

• Better results after thinning 

• Accurate and reproducible results with maximum stability 

• High productivity with beam currents up to 100 nA 

• Exceptional resolution of FIB with less than 3 nm 

Purchase of Equipment: :
FAPERJ E_02/2013 Notice; Support for the acquisition of major equipment; E-26/110.043/2013. Project named "Implementation of the Field-emission and double-beam scanning electron microscopy laboratory in the biomedical field". Price R$ 1,500,000.00 .

RULES FOR USE:

- Form - Request services by completing the form and sending it to the e-mail: marcopassos@globo.com  

-  Planner - (Equipment under maintenance) no appointments are currently being made.

Relevant remarks: 

• The files generated will be the responsibility of the user: users must take their CD. 

• The microscope is not connected to the Internet 

• Pen drives are not allowed. 

• Each session will last 3 hours max. 

• Only the responsible technician will operate the equipment. 

• There will be morning (9 am to 12 pm) or afternoon (2 pm to 5 pm) shifts. 

• No-show and delays longer than 15 min must be notified in advance. 

• For better service, we stipulate a maximum of 9 hours per user per week. 

• The scheduling of sessions will be cataloged by user, programming one appointment at a time. The next appointment can only be scheduled after use. 

• Sessions must be accompanied by the user. It is not the technician's responsibility to know the sample or to interpret the results.